1.

Conference Proceedings
Conference Proceedings
1. Surface and Bulk Properties of Oxygenated FZ Silicon Wafers for Particle Detector Applications
Bellutti, P. ; Boscardin, M. ; Betta, G.-F.Dalla ; Ferrario, L. ; Gregori, P. ; Zorzi, N.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.501-508,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
2.

Conference Proceedings
Conference Proceedings
2. On the Improving of the Gate Oxide Reliability
Bellutti, P. ; Boscardin, M. ; Zen, M. ; Zorzi, N.
Pub. info.: The physics and chemistry of SiO[2] and the Si-SiO[2] interface-3, 1996 : proceedings of the Third International Symposium on the Physics and Chemistry of SiO[2] and the Si-SiO[2] Interface.  pp.635-644,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-1
3.

Conference Proceedings
Conference Proceedings
3. Interstitial Oxygen Concentration Role in the DW-LOCOS CMOS Technology
Bellutti, P. ; Boscardin, M. ; Zen, M. ; Zordi, N. ; Vrtacnik, D. ; Calderara, M. ; Soncini, G.
Pub. info.: Proceedings of the Fourth International Symposium on High Purity Silicon.  pp.338-344,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-13