1.

Conference Proceedings
Conference Proceedings
1. Phase Formation at Rapid Thermal Annealing of Nickel Contacts on C-Face n-Type 4H-SiC
Ferrero, S. ; Albonico, A. ; Meotto, U. M. ; Rambola, G. ; Porro, S. ; Giorgis, F. ; Perrone, D. ; Scaltrito, L. ; Bontempi, E. ; Depero, L. E. ; Richieri, G. ; Merlin, L.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.733-736,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
2.

Conference Proceedings
Conference Proceedings
2. SnO2 Thin Films Doped or Catalyzed with Mo: Structural and Gas Sensing Properties
Zampiceni, E. ; Bontempi, E. ; Sherveglieri, G. ; Depero, L.F.
Pub. info.: Chemical and biological sensors and analytical methods II : proceedings of the international symposium.  pp.475-479,  2001.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-18
3.

Conference Proceedings
Conference Proceedings
3. A Micro-Raman Study of Niobium Titanium Oxide Powders Obtained by Laser-Induced Synthesis
Depero, L. E. ; Sangaletti, L. ; Bontempi, E. ; Salari, R. ; Casale, C. ; Musci, M. ; Notaro, M.
Pub. info.: Advanced catalytic materials 1996 : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A..  pp.241-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 454
4.

Conference Proceedings
Conference Proceedings
4. Development of multilayer coatings for solar space experiments
Pelizzo, M.-G. ; Patelli, A. ; Nicolosi, P. ; Rigato, V. ; Salmaso, G. ; Bontempi, E. ; Gardiol, D.
Pub. info.: Innovative telescopes and instrumentation for solar astrophysics : 24-28 August 2002, Waikoloa, Hawaii, USA.  pp.381-392,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4853