1.

Conference Proceedings
Conference Proceedings
1. Defect Content Evaluation in Single-Crystal AlN Wafers
Bondokov, Robert T. ; Morgan, Kenneth E. ; Shetty, Raj ; Liu, Wayne ; Slack, Glen A. ; Goorsky, Mark ; Schowalter, Leo J.
Pub. info.: GaN, AlN, InN and related materials : symposium held November 28-December 2, 2005, Boston, Massachusetts, U.S.A..  pp.763-768,  2006.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 892
2.

Conference Proceedings
Conference Proceedings
2. Dislocation Content of Etch Pits in Hexagonal Silicon Carbide
Khlebnikov, Igor I. ; Lari, Mohsen B. ; Khlebnikov, Yuri I. ; Bondokov, Robert T. ; Ayyagari, Ramakrishna ; Muzykov, Peter ; Sudarshan, Tangali S. ; Anderson, T. ; Whitlock, J.B.
Pub. info.: Silicon carbide--materials, processing and devices : symposium held November 27-29, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 640