1.

Conference Proceedings

Conference Proceedings
Zistl,Ch. ; Sielemann,R. ; Hsslein,H. ; Gall,S. ; Braunig,D. ; Bollmann,J.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.53-58,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Alves,E. ; Bollmann,J. ; Deicher,M. ; Carmo,M.C. ; Henry,M.O. ; Knopf,M.H.A. ; Leitao,J.P. ; Magerle,R. ; McDonagh,C.J.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.473-478,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263