1.

Conference Proceedings
Conference Proceedings
1. Rapid photo-goniometric technique for LED emission characterization
Boher, P. ; Luet, M. ; Leroux, T.
Pub. info.: Fourth international conference on solid state lighting : 3-6 August 2004, Denver, Colorado, USA.  pp.99-110,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5530
2.

Conference Proceedings
Conference Proceedings
2. New method for determination of the photoresist Dill parameters using spectroscopic ellipsometry
Boher, P. ; Defranoux, C. ; Piel, J. P. ; Stehle, J. -L. P.
Pub. info.: Microlithography 1999 : advances in resist technology and processing XVI : 15-17 March 1999, Santa Clara, California.  pp.126-137,  1999.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3678
3.

Conference Proceedings
Conference Proceedings
3. Real Time Spectroscopic Ellipsometry: A New Tool to Characterize SOI Wafers
Boher, P. ; Piel, J.P. ; Stehle, J.L.
Pub. info.: Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding : science, technology, and applications.  pp.249-256,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-36
4.

Conference Proceedings
Conference Proceedings
4. * Characterization of ultra-thin Gate Dielectrics by Grazing X-Ray Reflectance and Spectroscopic Ellipsometry on the Same Instrument
Boher, P. ; Stehle, J.L. ; Defranoux, C. ; Bourtault, S. ; Piel, J.P. ; Evrard, P.
Pub. info.: Rapid thermal and other short-time processing technologies II : proceedings of the international symposium.  pp.67-78,  2001.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-9
5.

Conference Proceedings
Conference Proceedings
5. Spectroscopic Ellipsometry Applied to the Characterization of GaN and AIGaN/GaN Heterostructures
Boher, P. ; Bourtault, S. ; Piel, J.P.
Pub. info.: State-of-the-art program on compound semiconductors XXXVIII and wide bandgap semiconductors for photonic and electronic devices and sensors III : proceedings of the international symposia.  pp.258-264,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-4
6.

Conference Proceedings
Conference Proceedings
6. BISTABLE DEFECTS INDUCED IN GaAs BY H2 PLASMA PROCESS
Boddaert, X ; Vuillaume, D. ; Stievenard, D. ; Bourgoin, J. C. ; Boher, P.
Pub. info.: Rapid thermal annealing/chemical vapor deposition and integrated processing : sympoisium held April 25-28, 1989, San Diego, California, U.S.A..  pp.425-430,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 146
7.

Conference Proceedings
Conference Proceedings
7. Structural Characterization of Different Insulating Films by Spectroscopic Ellipsometry and Grazing X-ray Reflectance
Boher, P. ; Stehle, J. L. ; Hennet, L.
Pub. info.: Amorphous and crystalline insulating thin films--1996 : symposium held December 2-4, 1996, Boston, Massachusetts, U.S.A..  pp.369-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 446
8.

Conference Proceedings
Conference Proceedings
8. Very Low Surface Roughness in Laser Crystallized Polycrystalline Silicon
Mourgues, K. ; Pichon, L. ; Raoult, F. ; Mohammed-Brahim, T. ; Briand, D. ; Bonnaud, O. ; Lemoine, D. ; Boher, P. ; Sthele, M. ; Sthele, J. L.
Pub. info.: Flat panel display materials III : symposium held March 31-April 3, 1997, San Francisco, California, U.S.A..  pp.197-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 471
9.

Conference Proceedings
Conference Proceedings
9. Surface Roughness Characterization of Au Thin Films by Spectroscopic Ellipsometry, Grazing X-ray Reflectance, Light Scattering and Scanning Tunneling Microscopy
Boher, P. ; Stehle, J. L.
Pub. info.: Structure and evolution of surfaces : symposium held December 2-5, 1996, Boston, Massachusette, U.S.A..  pp.419-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 440
10.

Conference Proceedings
Conference Proceedings
10. Combine Spectroscopic Ellipsometry and Grazing X-ray Reflectance for Fine Characterization of Complex Epitaxial Structures
Boher, P. ; Stehle, J. L.
Pub. info.: Diagnostic techniques for semiconductor materials processing II : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A..  pp.515-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 406