1.

Conference Proceedings

Conference Proceedings
Nafria, M. ; Blasco, X. ; Porti, M. ; Aguilera, L. ; Aymerich, X.
Pub. info.: Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices.  pp.435-447,  2006.  Dordrecht.  Springer
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 220
2.

Conference Proceedings

Conference Proceedings
Blasco, X. ; Nafria, M. ; Aymerich, X.
Pub. info.: Nanotechnology.  pp.558-564,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5118