1.

Conference Proceedings
Conference Proceedings
1. Excess Carrier Lifetime and Surface Recombination Velocity in Dielectrically Isolated SI-Tubs
Meynants, G. ; Poortmans, J. ; Mertens, R. ; Jones, S. ; Polce, N. ; Blackstone, S.
Pub. info.: Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding : science, technology, and applications.  pp.257-263,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-36
2.

Conference Proceedings
Conference Proceedings
2. Effect of Material Properties on Stress-Induced Defect Generation in Trench SOI
Nevin, W.A. ; Somasundram, K. ; Blackstone, S. ; Magee, S. ; Paxton, A.T.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.524-531,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
3.

Conference Proceedings
Conference Proceedings
3. Bonded Silicon Silicide on Insulator (S2OI) a Study of Chemical, Physical and Optical Properties for Advanced Device Fabrication
Nayar, V. ; Carline, R.T. ; Newey, J. ; Pidduck, A.J. ; Reeves, C. ; Russell, J. ; Williams, G. ; Quinn, C. ; Nevin, A. ; Blackstone, S. ; Feindt, S.
Pub. info.: Proceedings of the Fourth International Symposium on Semiconductor Wafer Bonding : science, technology, and applications.  pp.544-551,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-36
4.

Conference Proceedings
Conference Proceedings
4. HVIC Process on Bonded Wafers with Internal Gettering
Polce, N. ; Calley, M. ; Jones, S. ; Blackstone, S. ; Martin, P.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.470-472,  1999.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-35
5.

Conference Proceedings
Conference Proceedings
5. State of the Art Deep Silicon Anisotropic Etching on SOI Bonded Substrates for Dielectric Isolation and MEMS Applications
Gormley, C. ; Yallup, K. ; Nevin, W.A. ; Bhardwaj, J. ; Ashraf, H. ; Huggett, P. ; Blackstone, S.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.350-361,  1999.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-35
6.

Conference Proceedings
Conference Proceedings
6. Complementary Bipolar Fabricated by the Bonding of Patterned Buried Layers
Irissou, P. ; Pilloud, V. ; Yallup, K. ; Brown, A. ; Gaston, G. ; Blackstone, S.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.438-442,  1999.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-35
7.

Conference Proceedings
Conference Proceedings
7. 3-D Self Assembly of Opto-Mechanical Structures Using Bonded Silicon-on-Insulator
Syms, R.R.A. ; Blackstone, S.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.415-419,  1999.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-35
8.

Conference Proceedings
Conference Proceedings
8. Form C Opto-Solid State Relay on Bonded Wafer with 1600V Isolation
Sinclair, P. ; Whitney, D. ; Taggart, W. ; Yallup, K. ; Blackstone, S.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.402-406,  1999.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-35
9.

Conference Proceedings
Conference Proceedings
9. Mechanical Thinning for SOI
Blackstone, S.
Pub. info.: Proceedings of the Third International Symposium on Semiconductor Wafer Bonding : physics and applications.  pp.56-71,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-7
10.

Conference Proceedings
Conference Proceedings
10. Oxidation Induced Crystalline Defects in Bonded SOI Wafers
Papakonstantinou, P. ; Somasundram, K. ; Cao, X. ; Quinn, C. ; Yallup, K. ; Nevin, W.A. ; Blackstone, S.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.178-186,  1999.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-35