Nondestructive evaluation and health monitoring of aerospace materials and composites III : 16-17 March 2004, San Diego, California, USA. pp.29-40, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Testing, Reliability, and Application of Micro- and Nano-Material Systems. pp.172-182, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Testing, Reliability, and Application of Micro- and Nano-Material Systems. pp.213-222, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Blackshire, J.L. ; Hoffmann, J. ; Kropas-Hughes, C.V. ; Tansel, I.
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Testing, Reliability, and Application of Micro- and Nano-Material Systems. pp.93-103, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Malas, J.C. ; Kropas-Hughes, C.V. ; Blackshire, J.L. ; Moran, T. ; Peeler, D. ; Frazier, W.G. ; Parker, D.
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Testing, Reliability, and Application of Micro- and Nano-Material Systems. pp.28-36, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization. pp.434-443, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems. pp.184-193, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Testing, Reliability, and Application of Micro- and Nano-Material Systems II. pp.168-178, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Testing, Reliability, and Application of Micro- and Nano-Material Systems II. pp.158-167, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Meyendorf, N. ; Sathish, S. ; Druffner, C.J. ; Blackshire, J.L. ; Hoffmann, J.P. ; Zhan, Q. ; Andrews, R.J.
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Testing, Reliability, and Application of Micro- and Nano-Material Systems II. pp.256-265, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering