1.

Conference Proceedings

Conference Proceedings
Chen, H. ; Chau, C. ; Butler, T. ; Landes, B. ; Bishop, M. ; Bellmore, D. ; Chum, S. ; Dryzga, S.
Pub. info.: ANTEC 2003, annual technical conference, May 4-8, Nashville, Tennessee.  pp.1401-1407,  2003.  Brookfield Center, Conn..  Society of Plastics Engineers
Title of ser.: Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Ser. no.: 61
2.

Conference Proceedings

Conference Proceedings
Miller, A.C. ; Farr, M.D. ; Bishop, M. ; Williams, D.
Pub. info.: Remote sensing for agriculture, ecosystems, and hydrology V : 8-10 September 2003, Barcelona, Spain.  pp.333-339,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5232
3.

Technical Paper

Technical Paper
Bishop, M.
Pub. info.: NASA Technical Reports.  (NASA-TM-89316),  pp.1-17,  1986.  National Aeronautics and Space Administration
4.

Technical Paper

Technical Paper
Bishop, M.
Pub. info.: NASA Technical Reports.  (NASA-TM-89205),  pp.1-20,  1986.  National Aeronautics and Space Administration
5.

Conference Proceedings

Conference Proceedings
Allgair, J. A. ; Bunday, B. D. ; Bishop, M. ; Lipscomb, P. ; Orji, N. G.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XX.  pp.61520C-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6152
6.

Conference Proceedings

Conference Proceedings
Silver, R.M. ; Stocker, M.T. ; Attota, R. ; Bishop, M. ; Jun, J.-S.J. ; Marx, E. ; Davidson, M.P. ; Larrabee, R.D.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  1  pp.103-120,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038
7.

Conference Proceedings

Conference Proceedings
Bunday, B.D. ; Bishop, M. ; Villarrubia, J.S. ; Vladar, A.E.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  1  pp.674-688,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038
8.

Conference Proceedings

Conference Proceedings
Russo, B. ; Bishop, M.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  2  pp.793-802,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038
9.

Conference Proceedings

Conference Proceedings
Maldonado, J.-L. ; Bishop, M. ; Fuentes-Hernandez, C. ; Domercq, B. ; Barlow, S. ; Thayumanavan, S. ; Malagoli, M. ; Manoharan, M. ; Bredas, J.-L. ; Marder, S.R. ; Kippelen, B.
Pub. info.: Organic Photorefractive and Photosensitive Materials for Holographic Applications.  pp.42-50,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4802
10.

Conference Proceedings

Conference Proceedings
Bingham, P.R. ; Price, J.R. ; Tobin, K.W., Jr. ; Karnowski, T.P. ; Bennett, M.H. ; Bogardus, E.H. ; Bishop, M.
Pub. info.: Process and Materials Characterization and Diagnostics in IC Manufacturing.  pp.115-126,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5041