Moyer J. P., Paesler A. M.
Kluwer Academic Publishers
|
Drews,D., Noell,W., Ehrfeld,W., Lacher,M., Mayr,K., Marti,O., Serwatzy,C., Abraham,M.
SPIE-The International Society for Optical Engineering
|
Hrynevych M., Butler J. D., Nugent A. K., Roberts A.
Kluwer Academic Publishers
|
M.H.P. Moers, A.G.T. Ruiter, A. Jalocha, N.F. van Hulst, W.H.J. Kalle
Society of Photo-optical Instrumentation Engineers
|
Tomanek P.
Kluwer Academic Publishers
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Hartmann T., Gatz R., Wiegrabe W., Kramer A., Hillebrand A., Lieberman K., Baumeister W., Guckenberger R.
Kluwer Academic Publishers
|
Van Labeke D., Barchiesi D.
Kluwer Academic Publishers
|
Fuse, T., Takahashi, F., Tsukahara, H.
SPIE - The International Society of Optical Engineering
|
Fischer C. U.
Kluwer Academic Publishers
|
Wang, H., Liao, C., Fan, G., Liu, S.-H., Wu, Y., Wang, B., Zeng, G., Cai, J.
SPIE - The International Society of Optical Engineering
|
Naghski,D.H., Lindsay,S.M., Poweleit,C.D., Brabander,G.N.De, Subramaniam,V., Jackson,H.E., Boyd,J.T.
SPIE-The International Society for Optical Engineering
|
Vaez-Iravani M., Toledo-Crow R.
Kluwer Academic Publishers
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