Bertussi, B. ; Natoli, J.-Y. ; During, A. ; Commandre, M. ; Gallais, L. ; Rullier, J.L. ; Bercegol, H. ; Bouchut, P.
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Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France. pp.575-580, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Pommies, M. ; Damiani, D. ; Bertussi, B. ; Capoulade, J. ; Natoli, J. -Y. ; Piombini, H. ; Mathis, H.
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Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany. pp.59651K-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Natoli, J.-Y. ; Bertussi, B. ; Gallais, L. ; Commandre, M. ; Amra, C.
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Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France. pp.182-187, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Natoli, J.-Y. ; Gallais, L. ; Bertussi, B. ; Commandre, M. ; Amra, C.
Pub. info.:
Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization. pp.224-237, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering