Bergonzo, P. ; Foulon, F. ; Marshall, R. D. ; Jany, C. ; Brambilla, A. ; McKeag, R. D. ; Jackman, R. B.
Pub. info.:
Semiconductors for room-temperature radiation detector applications II : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.441-, 1997. Pittsburgh, PA. MRS - Materials Research Society
Foulon, F. ; Bergonzo, P. ; Brambilla, A. ; Jany, C. ; Guizard, B. ; Marshall, R. D.
Pub. info.:
Semiconductors for room-temperature radiation detector applications II : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A.. pp.591-, 1997. Pittsburgh, PA. MRS - Materials Research Society
Bergonzo, P. ; Foulon, F. ; Bramlilla, A. ; Tromson, D. ; Mer, C. ; Guizard, B. ; Haan, S.
Pub. info.:
Scientific basis for nuclear waste management XXIII : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A.. pp.511-, 2000. Pittsburgh, Pa.. MRS-Materials Research Society
Bergonzo, P. ; Tromson, D. ; Brambilla, A. ; Mer, C. ; Guizard, B. ; Foulon, F.
Pub. info.:
Applications of synchrotron radiation techniques to materials science V : sympoisum held November 29-December 3, 1999, Boston, Massachusetts, U.S.A.. pp.125-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Patel, P. ; Kogelschatz, U. ; Bergonzo, P. ; Boyd, I. W.
Pub. info.:
Rapid thermal and integrated processing : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A.. pp.299-304, 1991. Pittsburgh, Pa.. Materials Research Society
Hochedez, J.-F. ; Schuehle, U.H. ; Pau, J.L. ; Alvarez, J. ; Hainaut, O. ; Appourchaux, T.P. ; Auret, D.F. ; Belsky, A. ; Bergonzo, P. ; Castex, M.-C. ; Deneuville, A. ; Dhez, P. ; Fleck, B. ; Haenen, K. ; Idir, M. ; Kleider, J.-P. ; Lefeuvre, E. ; Lemaire, P. ; Monroy, E. ; Muret, P. ; Munoz, E. ; Nesladek, M. ; Omnes, F. ; Pace, E. ; Peacock, A.J. ; Van Hoof, C.A.
Pub. info.:
Innovative telescopes and instrumentation for solar astrophysics : 24-28 August 2002, Waikoloa, Hawaii, USA. pp.419-426, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering