Advanced optical damage studies using x-ray interferometric microscopy [5919-21]
- Author(s):
Rus, B. ( Institute of Physics (Czech Republic); ) Jamelot, G. ( Univ. Pari-Sud (France); ) Bercegol. H. ( Commissariat a I’Energie Atomique (France); ) Kozlova, M. Mocek, T. Homer, P Polan, J. Stupka, M. ( Institute of Physics (Czech Republic); ) Cassou, K. Kazamias, S. Klisnick, A. Ros, D. ( Univ. of Paris-Sud (France); ) Danson, C. Hawkes, S. ( Rutherford Appleton Lab. (United Kingdom) ) - Publication title:
- Soft X-Ray Lasers and Applications VI
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5919
- Pub. Year:
- 2005
- Page(from):
- 59190K
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819459244 [0819459240]
- Language:
- English
- Call no.:
- P63600/5919
- Type:
- Conference Proceedings
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