Materials for infrared detectors II : 8-9 July 2002 ,Seattle, Washington, USA. pp.129-135, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Horn, S. ; Norton, P. ; Cincotta, T. ; Stoltz, A.J. Jr., ; Benson, J.D. ; Perconti, P. ; Campbell, J.
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Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA. pp.44-51, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Chu, M. ; Gurgenian, H.K. ; Mesropian, S. ; Terterian, S. ; Wang, C.C. ; Benson, J.D. ; Dinan, J.H. ; Becker, L.S.R.
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Infrared technology and applications XXIX : 21-25 April 2003, Orlando, Florida, USA. pp.103-110, 2003. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Stoltz, A.J. ; Mason, Whitney ; Benson, J.D. ; Dinan, J.H. ; McCormack, K. ; Kaleczyc, A.
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Amorphous and heterogeneous silicon-based films - 2002 : symposium held April 2-5, 2002, San Francisco, California, U.S.A.. pp.67-76, 2002. Warrendale. Materials Research Society
Advances in Resist Technology and Processing XIX. Part Two pp.1224-1227, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering