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Conference Proceedings
Conference Proceedings
1. *NEUTRAL IMPURITY DISORDERING OF III-V QUANTUM WELL STRUCTURES FOR OPTOELECTRONIC INTEGRATION
Marsh, J. H. ; Andrew, S. R. ; Ayling, S. G. ; Beauvais, J. ; Bradshaw, S. A. ; Bryce, A. C. ; Hansen, S. I. ; De La Rue, R. M. ; Glew, R. W.
Pub. info.: Advanced III-V compound semiconductor growth, processing and devices : symposium held Decmber[i.e. December] 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.679-690,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 240
2.

Conference Proceedings
Conference Proceedings
2. Plasma deposited and evaporated thin resist for template fabrication [6281-35]
Lavallee, E. ; Beauvais, J. ; Mangoua, T. B. ; Drouin, D.
Pub. info.: EMLC 2006 : 22nd European Mask and Lithography Conference : 23-26 January 2006, Dresden, Germany.  pp.62810O-,  2006.  Bellingham, Wash.,.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6281
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Conference Proceedings
Conference Proceedings
3. Effects of damage accumulation on quantum well intermixing by low-energy ion implantation in photonic devices
Chicoine, M. ; Francois, A. ; Tavares, C. ; Chevobbe, S. ; Schiettekatte, F. ; Aimez, V. ; Beauvais, J. ; Beerens, J.
Pub. info.: Applications of photonic technology 6 : closing the gap between theory, development, and application : Photonics North 2003.  pp.423-431,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5260
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Conference Proceedings
Conference Proceedings
4. Dynamics of photo-excited carriers in self-assembled quantum dots (Invited Paper)
Morris, D. ; Perret, N. ; Riabinina, D.A. ; Beerens, J. ; Aimez, V. ; Beauvais, J. ; Fafard, S.
Pub. info.: Applications of photonic technology 5 : closing the gap between theory, development, and application : Photonics North 2002.  pp.705-710,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4833
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Conference Proceedings
Conference Proceedings
5. High-performance terahertz source using ion implanted photoconductive antenna
Salem, B. ; Morris, D. ; Aimez, V. ; Beerens, J. ; Beauvais, J. ; Houde, D.
Pub. info.: Terahertz and gigahertz electronics and photonics IV : 23-25 January 2005, San Jose, California, USA.  pp.193-199,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5727
6.

Conference Proceedings
Conference Proceedings
6. Segmented waveguide array gratings made by electron beam lithography [6343-51]
Grondin, E. ; Genest, J. ; Duguay, M. A. ; Beauvais, J. ; Aimez, V.
Pub. info.: Photonics North 2006.  pp.63431F-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6343
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Conference Proceedings
Conference Proceedings
7. Evaporated resist for the fabrication and replication of LEEPL mask
Cloutier, M. ; Awad, Y. ; Lavallee, E. ; Turcotte, D. ; Beauvais, J. ; Drouin, D. ; Mun, L.K. ; Yang, P. ; Lafrance, P. ; Legario, R. ; Yoshida, A. ; Nozue, H.
Pub. info.: Emerging Lithographic Technologies VIII.  pp.521-528,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5374
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Conference Proceedings
Conference Proceedings
8. Nanopatterning on fragile or 3D surfaces with sterol-based vapor-deposited electron beam resist
Legario, R.R. ; Kelkar, P.S. ; Beauvais, J. ; Lavallee, E. ; Drouin, D. ; Cloutier, M. ; Turcotte, D. ; Yang, P. ; Mun, L.K. ; Awad, Y. ; Lafrance, P.J.
Pub. info.: Advances in Resist Technology and Processing XXI.  pp.903-914,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5376