1.

Conference Proceedings
Conference Proceedings
1. Comparative Raman And Tem Analysis Of The Evolution Of Platelet Defects In Plasma Hydrogenated And Annealed Czochralski Silicon
Job, R. ; Beaufort, M.-F. ; Barbot, J.-F. ; Ulyashin, A.G. ; Fahrner, W.R.
Pub. info.: Defect and impurity engineered semiconductors and devices III : symposium held April 1-5, 2002, San Francisco, California, U.S.A..  pp.217-222,  2002.  Warrendale, Pa.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 719
2.

Conference Proceedings
Conference Proceedings
2. Thermal Evolution of Hydrogen Related Defects in Silicon Investigated by u-Raman Spectroscopy
Ma, Y. ; Huang, Y.L. ; Job, R. ; Fahrner, W.R. ; Beaufort, M.-F. ; Barbot, J. -F.
Pub. info.: High purity silicon VIII : proceedings of the international symposium.  pp.385-394,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-05