1.

Conference Proceedings

Conference Proceedings
Brandt,M.S. ; Bayerl,M.W. ; Reinacher,N.M. ; Wimbauer,T. ; Stutzmann,M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.963-968,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Wimbauer,T. ; Brandt,M.S. ; Bayerl,M.W. ; Stutzma,M. ; Hofmann,D.M. ; Mochizuki,Y. ; Mizuta,M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1309-1314,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263