1.

Conference Proceedings
Conference Proceedings
1. Swift Heavy Ion Irradiation Effects in SiC Measured by Positrons
Liszkay, L. ; Havancsak, K. ; Barthe, M.-F. ; Desgardin, P. ; Henry, L. ; Kajcsos, Z. ; Battistig, G. ; Szilagyi, E. ; Skuratov, V.A.
Pub. info.: Positron annihilation, ICPA-12 : Proceedings of the 12th International Conference on Positron Annihilation, August 6-12, 2000, München, Germany.  pp.123-125,  2001.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 363-365
2.

Conference Proceedings
Conference Proceedings
2. Ion Bombardment Induced Damage in Silicon Carbide Studied by Ion Beam Analytical Methods
Szilagyi, E. ; Khanh, N.Q. ; Horvath, Z.E. ; Lohner, T. ; Battistig, G. ; Zolnai, Z. ; Kotai, E. ; Gyulai, J.
Pub. info.: Silicon carbide and related materials : ECSCRM2000, proceedings of the 3rd European Conference on Silicon Carbide and Related Materials, Kloster Banz, Germany, September 2000.  pp.271-274,  2001.  Uetikon-Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 353-356
3.

Conference Proceedings
Conference Proceedings
3. RBS-Channeling and EPR Studies of Damage in 2 MeV Al2+_Implanted 6H-SiC Substrates
Morilla, Y. ; Garcia Lopez, J. ; Battistig, G. ; Cantin, J. L. ; Cheang-Wong, J. C. ; Bardeleben, H. J. von ; Respaldiza, M. A.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.291-294,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
4.

Conference Proceedings
Conference Proceedings
4. Ion Beam Analysis and Computer Simulation of Damage Accumulation in Nitrogen Implanted 6H-SiC: Effects of Channeling
Zolnai, Z. ; Ster, A. ; Khanh, N. Q. ; Kotai, E. ; Posselt, M. ; Battistig, G. ; Lohner, T. ; Gyulai, J.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.637-640,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
5.

Conference Proceedings
Conference Proceedings
5. High-Sensitivity Ion Beam Analytical Method for Studying Ion-Implanted SiC
Battistig, G. ; Lopez, J.G. ; Khanh, N.Q. ; Morilla, Y. ; Respaldiza, M.A. ; Szilagyi, E.
Pub. info.: Silicon carbide and related materials 2002 : ECSCRM2002, proceedings of the 4th European Conference on Silicon Carbide and Related Materials, September 2-5, 2002, Linköping, Sweden.  pp.625-628,  2003.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 433-436