1.

Conference Proceedings
Conference Proceedings
1. Application of scatterometry for CD and profile metrology in 193-nm lithography process development
Chen, L.-J. ; Ke, C.-M. ; Yu, S.S. ; Gau, T.-S. ; Chen, P. ; Ku, Y.-C. ; Lin, B.J. ; Engelhard, D. ; Hetzer, D. ; Yang, J.Y. ; Barry, K.A. ; Yap, L. ; Yang, W.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  1  pp.568-576,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038
2.

Conference Proceedings
Conference Proceedings
2. Metrology exposure-induced resist and ARC damage
Yu, J. ; Viswanathan, A. ; Miyagi, M. ; Uchida, J. ; Lane, L. ; Barry, K.A. ; Kajitani, M. ; Kikuchi, T. ; Chan, K.C. ; Stanke, F.E.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.839-848,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375
3.

Conference Proceedings
Conference Proceedings
3. Characterization of integrated optical CD for process control
Yu, J. ; Uchida, J. ; van Dommelen, Y. ; Carpaij, R. ; Cheng, S. ; Pollentier, I. ; Viswanathan, A. ; Lane, L. ; Barry, K.A. ; Jakatdar, N.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.1059-1068,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375
4.

Conference Proceedings
Conference Proceedings
4. Scatterometry for contact hole lithography
Barry, K.A. ; Viswanathan, A. ; Niu, X. ; Bischoff, J.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVIII.  pp.1081-1086,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5375