Barritault, P. ; Getin, S. ; Chaton, P. ; Andre, B. ; Vinet, F. ; Fouque, B.
Pub. info.:
Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France. pp.12-20, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Barritault, P. ; Getin, S. ; Chaton, P. ; Vinet, F. ; Fouquee, B. ; Stehle, J.L.
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Biomedical nanotechnology architectures and applications : 20-24 January 2002, San Jose, USA. pp.9-16, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Petit, J. ; Barritault, P. ; Hazart, J. ; Chaton, P. ; Boher, P. ; Luet, M. ; Leroux, T.
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Metrology, Inspection, and Process Control for Microlithography XVIII. pp.210-221, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Boher, P. ; Luet, M. ; Leroux, T. ; Petit, J. ; Barritault, P. ; Hazart, J. ; Chaton, P.
Pub. info.:
Metrology, Inspection, and Process Control for Microlithography XVIII. pp.1302-1313, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering