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35 results

Conference Proceedings

1. Immunosensing Using Electrochemical Impedance Spectroscopy on Functionalized Gold Electrodes

Ameur, S. ; Martelet, S. ; Renault, N. Jaifrezic- ; Chorelon, J.M. ; Plossu, C. ; Barbier, D. ; Ben Quada, H.

Pub. info.:	Proceedings of the Symposium on Chemical and Biological Sensors and Analytical Electrochemical Methods. pp.1019-1023, 1997. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	97-19

Conference Proceedings

2. ON THE ORIGIN OF INTERNAL GETTERING SUPPRESSION IN LOW CARBON CZ SILICON BY RAPID THERMAL ANNEALING

Maddalon-Vinante, C. ; Vallard, J.P. ; Barbier, D.

Pub. info.:	Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology. pp.844-855, 1994. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	1994-10

Conference Proceedings

3. STRUCTURAL AND ELECTRICAL PROPERTIES OF POLY- SILICON FILMS DEPOSITED AT 5 mbar IN A RTP REACTOR

Semmache, B. ; Kaddour-Krieger, S. ; Lemiti, M. ; Barbier, D. ; Fayeulle, S. ; Laugier, A.

Pub. info.:	Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology. pp.311-321, 1994. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	1994-10

Conference Proceedings

4. DEFECT STATES INDUCED BY RAPID THERMAL ANNEALING IN VIRGIN OR IMPLANTED CZOCHRALSKY-GROWN SILICON

Remram, M. ; Barbier, D. ; Joly, J.?F. ; Laugier, A.

Pub. info.:	Beam-solid interactions and transient processes : symposium held December 1-4, 1986, Boston, Massachusetts, U.S.A.. pp.705-710, 1987. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	74

Conference Proceedings

5. TRANSITION METALS IN ELECTRICALLY ACTIVE SITES AFTER INCOHERENT LIGHT ANNEALING OF BORON-DOPED CEOCHRALSKI-GROWN SILICON

Barbier, D. ; Remram, M. ; Zhu, J.

Pub. info.:	Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.223-228, 1988. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	104

Conference Proceedings

6. IMPLANTED IMPURITY INCORPORATION AND SEGREGATION PHENOMENA INDUCED BY PEBA IN SILICON

Chaussemy, G. ; Barbier, D. ; Laugier, A.

Pub. info.:	Energy beam-solid interactions and transient thermal processing/1984 : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A.. pp.257-264, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	35

Conference Proceedings

7. A STUDY OF ELECTRICALLY ACTIVE DEFECTS INDUCED BY PULSED-ELECTRON-BEAM ANNEALING IN (100) N-TYPE VIRGIN SILICON

Doghmane, M. S. ; Barbier, D. ; Laugier, A.

Pub. info.:	Energy beam-solid interactions and transient thermal processing/1984 : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A.. pp.287-292, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	35

Conference Proceedings

8. ARSENIC REDISTRIBUTION AND OUTDIFFUSION IN IMPLANTED CZOCHRALSKI-GROWN P-TYPE SILICON DURING RAPID THERMAL ANNEALING

Chaussemy, G. ; Canut, B. ; Kumar, S. N. ; Barbier, D. ; Laugier, A.

Pub. info.:	Fundamentals of beam-solid interactions and transient thermal processing : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A.. pp.695-700, 1988. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	100

Conference Proceedings

9. ARSENIC IMPLANT ACTIVATION AND REDISTRIBUTION IN P-TYPE SILICON INDUCED BY PULSED ELECTRON BEAM ANNEALING

Barbier, D. ; Baghdadi, M. ; Laugier, A. ; Cachard, A.

Pub. info.:	Laser-solid interactions and transient thermal processing of materials : symposium held November 1982 in Boston, Massachusetts, U.S.A.. pp.419-424, 1983. New York. North-Holland
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	13

10.

Conference Proceedings

10. PULSED ELECTRON BEAM ANNEALING INDUCED DEEP LEVEL DEFECTS IN VIRGIN SILICON

Barbier, D. ; Kechouane, M. ; Chantre, A. ; Laugier, A.

Pub. info.:	Laser-solid interactions and transient thermal processing of materials : symposium held November 1982 in Boston, Massachusetts, U.S.A.. pp.449-454, 1983. New York. North-Holland
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	13

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