1.

Conference Proceedings
Conference Proceedings
1. Specular spectral profilometry on metal layers
Bao,J. ; Niu,X. ; Jakatdar,N.H. ; Spanos,C.J. ; Bendik,J.J.
Pub. info.: Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California.  pp.882-892,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3998
2.

Conference Proceedings
Conference Proceedings
2. Physically based model for predicting volume shrinkage in chemically amplified resists
Jakatdar,N.H. ; Bao,J. ; Spanos,C.J. ; Subramanian,R. ; Rangarajan,B. ; Romano,A.R.
Pub. info.: In-line characterization, yield reliability, and failure analysis in microelectronics manufacturing : 19-21 May 1999, Edinburgh, Scotland.  pp.16-24,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3743
3.

Conference Proceedings
Conference Proceedings
3. Phase profilometry for the 193-nm lithography gate stack
Jakatdar,N.H. ; Niu,X. ; Bao,J. ; Spanos,C.J. ; Yedur,S.K. ; Deleporte,A.G.
Pub. info.: Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California.  pp.116-124,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3998
4.

Conference Proceedings
Conference Proceedings
4. Valid region recognition in digital images of medical x-ray imaging
Gao,J. ; Wang,Y. ; Bao,J. ; Yang,X. ; Hu,Q.
Pub. info.: Biomedical photonics and optoelectronic imaging : 8-10 November 2000, Beijing, China.  pp.139-144,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4224
5.

Conference Proceedings
Conference Proceedings
5. Active sensor wave propagation health monitoring of beam and plate structures
Giurgiutiu,V. ; Bao,J. ; Zhao,W.
Pub. info.: Smart structures and materials 2001 : Smart structures and integrated systems : 5-8 March, 2001, Newport Beach, USA.  pp.234-245,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4327
6.

Conference Proceedings
Conference Proceedings
6. Optical-electronic shape recognition system based on synergetic associative memory
Gao,J. ; Bao,J. ; Chen,D. ; Yang,Y. ; Yang,X.
Pub. info.: Applications of artificial neural networks in image processing VI : 25-26 January, 2001, San Jose, [California] USA.  pp.138-148,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4305
7.

Conference Proceedings
Conference Proceedings
7. Sensing and control system of process quality in C02 laser deep-penetration welding (Invited Paper)
Chen,W. ; Zhang,X. ; Bao,J. ; Wang,Y. ; Li,T. ; Jiang,P. ; Zhang,H.
Pub. info.: Laser processing of materials and industrial applications II : 16-19 September 1998, Beijing, China.  pp.287-297,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3550
8.

Conference Proceedings
Conference Proceedings
8. PACS development in China and the component PACS system
Bao,J. ; Gao,J.
Pub. info.: Medical imaging 2001 : PACS and integrated medical information systems : design and evaluation : 20-22 February 2001, San Diego, USA.  pp.380-385,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4323