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11 results

Conference Proceedings

1. High-k Gate Stacks Electrical Characterization at the Nanoscale using Conductive-AFM

Nafria, M. ; Blasco, X. ; Porti, M. ; Aguilera, L. ; Aymerich, X.

Pub. info.:	Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices. pp.435-447, 2006. Dordrecht. Springer
Title of ser.:	NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:	220

Conference Proceedings

2. Characterization of RTCVD Grown Si Films on SiO 2 for Nanotechnology Applications

Vizoso, J. ; Martin, F. ; Martinez, X. ; Garriga, M. ; Aymerich, X.

Pub. info.:	Proceedings of the Fifth International Symposium on Quantum Confinement : nanostructures. pp.27-39, 1998. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	98-19

Conference Proceedings

3. Optical integrated waveguides characterization by scanning near-field optical microscope

Borrise, X. ; Barniol, N. ; Perez-Murano, F. ; Abadal, G. ; Aymerich, X. ; Jimenez, D.

Pub. info.:	Optical microstructural characterization of semiconductors : sympoisum held November 29-30, 1999, Boston, Massachusetts, U.S.A.. pp.37-, 2000. Warrendale, Pa.. MRS-Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	588

Conference Proceedings

4. Mesoscopic transport in broken down ultrathin SiO2 films

Miranda, E. ; Sune, N. ; Rodriguez, R. ; Nafria, M. ; Aymerich, X.

Pub. info.:	Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A.. pp.93-, 2000. Warrendale, PA. MRS-Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	592

Conference Proceedings

5. Evaluation of the degradation dynamics of thin silicon dioxide films using model-independent procedures

Rodriguez, R. ; Nafria, M. ; Miranda, E. ; Sune, J. ; Aymerich, X.

Pub. info.:	Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A.. pp.147-, 2000. Warrendale, PA. MRS-Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	592

Conference Proceedings

6. SPECTROSCOPIC CHARACTERIZATION OF NANOSCALE MODIFICATION OF PASSIVATED Si(100) SURFACE BY STM

Perez-Murano, F. ; Barniol, N. ; Aymerich, X.

Pub. info.:	Determining nanoscale physical properties of materials by microscopy and spectroscopy. pp.549-, 1994. Pittsburgh, Pa.. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	332

Conference Proceedings

7. MOS-based nanocapacitor using C-AFM

Hill, D. ; Sadewasser, S. ; Aymerich, X.

Pub. info.:	Nanotechnology. pp.507-514, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5118

Conference Proceedings

8. Electrical characterization of atomic-force microscopy grown SiO2

Blasco, X. ; Nafria, M. ; Aymerich, X.

Pub. info.:	Nanotechnology. pp.558-564, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5118

Conference Proceedings

9. Nanometer-scale analysis of current limited stresses impact on SiO2 gate oxide reliability using C-AFM

Porti, M. ; Nafria, M. ; Aymerich, X.

Pub. info.:	Nanotechnology. pp.466-473, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5118

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Conference Proceedings

10. Charge storage in Si nanocrystals embedded in SiO2 with enhanced C-AFM

Porti, M. ; Avidano, M. ; Nafria, M. ; Aymerich, X. ; Carreras, J. ; Garrido, B.

Pub. info.:	Nanotechnology II. pp.43-51, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5838

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Author: Aymerich, X.