1.

Conference Proceedings
Conference Proceedings
1. *Challenges in interface trap characterization of deep sub-micron MOS devices using charge pumping techniques
Autran, J. L. ; Masson, P. ; Ghibaudo, G.
Pub. info.: Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A..  pp.275-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 592
2.

Conference Proceedings
Conference Proceedings
2. Analysis of MOS device capacitance-voltage characteristics based on the self-consistent solution of the schrodinger and poisson equations
Raynaud, C. ; Autran, J. L. ; Masson, P. ; Bidaud, M. ; Poncet, A.
Pub. info.: Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A..  pp.159-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 592
3.

Conference Proceedings
Conference Proceedings
3. Deposition and characterization of ultrathin Ta2O5 layers deposited on silicon from a Ta(OC2H5)5 precursor
Chaneliere, C. ; Autran, J. L. ; Raynard, J. P. ; Michailos, M. ; Barla, K. ; Ushikawa, H. ; Hiroe, A. ; Shimomura, K. ; Kakimoto, A.
Pub. info.: Structure and electronic properties of ultrathin dielectric films on silicon and related structures : symposium held November 29-December 1, 1999, Boston, Massachusetts, U.S.A..  pp.75-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 592