1.

Conference Proceedings

Conference Proceedings
Aswendt, P.
Pub. info.: Speckle metrology 2003 : 18-20 June 2003, Trondheim, Norway.  pp.117-122,  2003.  Bellingham, Wash.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4933
2.

Conference Proceedings

Conference Proceedings
Aswendt, P. ; Hofling, R. ; Hiller, K.
Pub. info.: Microsystems Metrology and Inspection.  pp.165-173,  1999.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3825
3.

Conference Proceedings

Conference Proceedings
Aswendt, P.
Pub. info.: Microsystems Engineering: Metrology and Inspection III.  pp.17-22,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5145
4.

Conference Proceedings

Conference Proceedings
Aswendt, P. ; Dean, T.
Pub. info.: Optical Micro- and Nanometrology in Manufacturing Technology.  pp.25-33,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5458
5.

Conference Proceedings

Conference Proceedings
Aswendt, P. ; Hofling, R. ; Gartner, S.
Pub. info.: Optical Measurement Systems for Industrial Inspection IV.  pp.393-400,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5856
6.

Conference Proceedings

Conference Proceedings
Holstein, D. ; Aswendt, P. ; Hofling, R. ; Schmidt, C.D. ; Juptner, W.
Pub. info.: International Conference on Applied Optical Metrology.  pp.429-436,  1998.  Bellingham, Wash..  SPIE--International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3407