1.
Conference Proceedings
Aswendt, P.
Pub. info.:
Speckle metrology 2003 : 18-20 June 2003, Trondheim, Norway . pp.117-122, 2003. Bellingham, Wash. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4933
2.
Conference Proceedings
Aswendt, P. ; Hofling, R. ; Hiller, K.
Pub. info.:
Microsystems Metrology and Inspection . pp.165-173, 1999. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3825
3.
Conference Proceedings
Aswendt, P.
Pub. info.:
Microsystems Engineering: Metrology and Inspection III . pp.17-22, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5145
4.
Conference Proceedings
Aswendt, P. ; Dean, T.
Pub. info.:
Optical Micro- and Nanometrology in Manufacturing Technology . pp.25-33, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5458
5.
Conference Proceedings
Aswendt, P. ; Hofling, R. ; Gartner, S.
Pub. info.:
Optical Measurement Systems for Industrial Inspection IV . pp.393-400, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5856
6.
Conference Proceedings
Holstein, D. ; Aswendt, P. ; Hofling, R. ; Schmidt, C.D. ; Juptner, W.
Pub. info.:
International Conference on Applied Optical Metrology . pp.429-436, 1998. Bellingham, Wash.. SPIE--International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3407