1.

Conference Proceedings

Conference Proceedings
Zhou, Y.D. ; Becker, C.R. ; Ashokan, R. ; Selamet, Y. ; Chang, Y. ; Boreiko, R.T. ; Betz, A.L. ; Sivananthan, S.
Pub. info.: Materials for infrared detectors II : 8-9 July 2002 ,Seattle, Washington, USA.  pp.121-128,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4795
2.

Conference Proceedings

Conference Proceedings
Zhou, Y. D. ; Zhao, J. ; Boreiko, R. ; Chang, Y. ; Selamet, Y. ; Ashokan, R. ; Becker, C. R. ; Betz, A. ; Sivananthan, S.
Pub. info.: Materials for infrared detectors III : 7-8 August 2003, San Diego, California, USA.  pp.99-106,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5209
3.

Conference Proceedings

Conference Proceedings
Velicu, S. ; Lee, T. S. ; Ashokan, R. ; Grein, C. H. ; Boieriu, P. ; Chen, Y. P. ; Dinan, J. H. ; Lianos, D.
Pub. info.: Materials for infrared detectors III : 7-8 August 2003, San Diego, California, USA.  pp.14-32,  2003.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5209
4.

Conference Proceedings

Conference Proceedings
Lee, T. -S. ; Zhao, J. ; Chang, Y. ; Ashokan, R. ; Sivananthan, S. ; Boieriu, P. ; Chen, Y. ; Brill, G. ; Wijewarnasuriya, P. S. ; Dhar, N. K.
Pub. info.: Infrared detector materials and devices : 4-5 August 2004, Denver, Colorado, USA.  pp.113-122,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5564