Zhou, Y.D. ; Becker, C.R. ; Ashokan, R. ; Selamet, Y. ; Chang, Y. ; Boreiko, R.T. ; Betz, A.L. ; Sivananthan, S.
Pub. info.:
Materials for infrared detectors II : 8-9 July 2002 ,Seattle, Washington, USA. pp.121-128, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Zhou, Y. D. ; Zhao, J. ; Boreiko, R. ; Chang, Y. ; Selamet, Y. ; Ashokan, R. ; Becker, C. R. ; Betz, A. ; Sivananthan, S.
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Materials for infrared detectors III : 7-8 August 2003, San Diego, California, USA. pp.99-106, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Velicu, S. ; Lee, T. S. ; Ashokan, R. ; Grein, C. H. ; Boieriu, P. ; Chen, Y. P. ; Dinan, J. H. ; Lianos, D.
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Materials for infrared detectors III : 7-8 August 2003, San Diego, California, USA. pp.14-32, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Lee, T. -S. ; Zhao, J. ; Chang, Y. ; Ashokan, R. ; Sivananthan, S. ; Boieriu, P. ; Chen, Y. ; Brill, G. ; Wijewarnasuriya, P. S. ; Dhar, N. K.
Pub. info.:
Infrared detector materials and devices : 4-5 August 2004, Denver, Colorado, USA. pp.113-122, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering