1.

Conference Proceedings
Conference Proceedings
1. Electron Irradiation Induced Vacancy Defects Detected by Positron Annihilation in 6H-SiC
Barthe, M. F. ; Henry, L. ; Arpiainen, S. ; Blondiaux, G.
Pub. info.: Silicon carbide and related materials 2004 : ECSCRM 2004 : proceedings of the 5th European Conference on Silicon Carbide and Related Materials, August 31 - September 4 2004, Bologna, Italy.  pp.473-476,  2005.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 483-485
2.

Conference Proceedings
Conference Proceedings
2. Crystallization of silica opals onto patterned silicon wafer [6182-57]
Ye, J. ; Zentel, R. ; Arpiainen, S. ; Ahopelto, J. ; Jonsson, F. ; Romanov, S. G. ; Sotomayor Torres, C.
Pub. info.: Photonic Crystal Materials and Devices III (i.e. V).  pp.61821U-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6182