1.

Conference Proceedings

Conference Proceedings
Cronin, J.P. ; Aruchamy, A. ; Rosenfelder, S. ; Kim, S.-J. ; Uhlmann, D.R. ; El-Bayoumi, O.H. ; Andrews, R.J.
Pub. info.: High-temperature superconductors : fundamental properties and novel materials processing : symposium held November 27-December 2, 1989, Boston, Massachusetts, U.S.A..  pp.321-324,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 169
2.

Conference Proceedings

Conference Proceedings
Jingcang, Zhang ; Aisheng, He ; Yujing, Huo ; Yusheng, He ; Uhlmann, D.R. ; El-Bayoumi, O.H. ; Andrews, R.J.
Pub. info.: High-temperature superconductors : fundamental properties and novel materials processing : symposium held November 27-December 2, 1989, Boston, Massachusetts, U.S.A..  pp.317-320,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 169
3.

Technical Paper

Technical Paper
Befrui, B. ; Corbinelli, G. ; Hoffmann, G. ; Andrews, R.J. ; Sankhalpara, S.R.
Pub. info.: 2009 SAE world congress : technical paper.  2009.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2009
4.

Technical Paper

Technical Paper
Tang, S.S. ; Riccardella, P.C. ; Mucciaradi, A.N. ; Andrews, R.J. ; Grady, J.E.
Pub. info.: AIAA/ASME/AHS Adaptive Structures Forum : a collection of technical papers, April 18-19, 1996, Salt Lake City, UT.  pp.338-348,  1996.  Washington, DC.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA/ASME/AHS Adaptive Structures Forum
Ser. no.: CP963
5.

Conference Proceedings

Conference Proceedings
Meyendorf, N. ; Sathish, S. ; Druffner, C.J. ; Blackshire, J.L. ; Hoffmann, J.P. ; Zhan, Q. ; Andrews, R.J.
Pub. info.: Testing, Reliability, and Application of Micro- and Nano-Material Systems II.  pp.256-265,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5392