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A New Device for In Situ Residual Stress Measurement during Fatigue Testing

Author(s):
Publication title:
ECRS 5 : proceedings of the Fifth European Conference on Residual Stresses : held September 28-30, 1999 in Delft-Noordwijkerhout, The Netherlands
Title of ser.:
Materials science forum
Ser. no.:
347-349
Pub. Year:
2000
Page(from):
358
Page(to):
362
Pages:
5
Pub. info.:
Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878498550 [0878498559]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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