1.

Conference Proceedings

Conference Proceedings
Lawton,R.A. ; Abraham,M. ; Lawrence,E.
Pub. info.: MEMS reliability for critical and space applications : 21-22 September 1999, Santa Clara, California.  pp.46-50,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3880
2.

Conference Proceedings

Conference Proceedings
Abraham,M. ; Ehrfeld,W. ; Lacher,M. ; Marti,O. ; Mayr,K. ; Noell,W. ; Guthner,P. ; Barenz,J.
Pub. info.: Micro-optical technologies for measurement, sensors, and microsystems II and Optical fiber sensor technologies and applications : 18-20 June 1997, Munich, FRG.  Part 1  pp.248-256,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3099
3.

Conference Proceedings

Conference Proceedings
Abraham,M. ; Arnold,J. ; Ehrfeld,W. ; Hesch,K. ; Mobius,H. ; Paatzsch,T. ; Schultz,C.
Pub. info.: Micromachining and microfabrication process technology : 23-24 October, 1995, Austin, Texas.  pp.164-173,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2639
4.

Technical Paper

Technical Paper
Karim,G.A. ; Ito,K. ; Abraham,M. ; Jensen,L.
Pub. info.: Gaseous fuels for engines.  pp.85-92,  1991.  Society of Automotive Engineering, Inc.
Title of ser.: SAE special publication
Ser. no.: SP-888
5.

Conference Proceedings

Conference Proceedings
Abraham,M. ; Ehrfeld,W. ; Lacher,M. ; Mayr,K. ; Noel,W. ; Guthner,P. ; Barenz,J.
Pub. info.: Micromachining and Imaging.  pp.34-42,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3009
6.

Conference Proceedings

Conference Proceedings
Drews,D. ; Noell,W. ; Ehrfeld,W. ; Lacher,M. ; Mayr,K. ; Marti,O. ; Serwatzy,C. ; Abraham,M.
Pub. info.: Materials and Device Characterization in Micromachining.  pp.76-83,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3512