1.

Conference Proceedings
Conference Proceedings
1. Defect Related Leakage Current Components in SiC Schottky Barrier Diode
K. Ohtsuka ; T. Nakatani ; A. Nagae ; H. Watanabe ; Y. Nakaki
Pub. info.: Defects-recognition, imaging and physics in semiconductors XIV : selected, peer reviewed papers from the 14th International Conference on Defects-Recognition, Imaging and Physics in Semiconductors, September 25-29, 2011, Miyazaki, Japan.  pp.53-56,  2012.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 725
2.

Conference Proceedings
Conference Proceedings
2. Characterization of SiO2/4H-SiC Interface by Device Simulation and Temperature Dependence of On-Resistance of SiC MOSFET
K. Ohtsuka ; S. Hino ; A. Nagae ; R. Tanaka ; Y. Kagawa
Pub. info.: Silicon carbide and related materials 2013 : selected, peer reviewed papers from the 15th International Conference on Silicon Carbide and Related Materials (ICSCRM 2013), September 29 - October 4, 2013, Miyazaki, Japan.  pp.993-996,  2014.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 778-780