1.

Conference Proceedings
Conference Proceedings
1. Thermal Alumina Scales on FeCrAl: Characterization and Growth Mechanism
S. Chevalier ; A. Galerie ; O. Heintz ; R. Chassagnon ; A. Crisci
Pub. info.: High temperature corrosion and protection of materials 7 : selected, peer reviewed papers from 7th International Symposium on High Temperature Corrosion and Protection of Materials, Les Embiez, France, May 18-23, 2008.  pp.915-922,  2008.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 595-598
2.

Conference Proceedings
Conference Proceedings
2. Coupling between the Raman Spectroscopy and Photoemission Microscopy Techniques: Investigation of Defects in Biased 4H-SiC pin Diodes
A. Thuaire ; M. Mermoux ; E. Bano ; A. Crisci ; F. Baillet ; K. Zekentes
Pub. info.: Silicon carbide and related materials 2006 : ECSCRM 2006, Proceedings of the 6th European Conference on Silicon Carbide and Related Materials, Newcastle upon Tyne, UK, September 2006.  pp.909-912,  2007.  Stafa-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 556-557
3.

Conference Proceedings
Conference Proceedings
3. Recent Structural Change in Remote Sensing Data Time Series Linked to Farm Management in Horn of Africa (1999 - 2009)
A. Crisci ; P. Vignaroli ; L. Genesio
Pub. info.: Proceedings of earth observation for land-atmosphere interaction science : 3-5 November 2010, Frascati, Italy.  2011.  Noordwijk, Netherlands.  ESA Communications
Title of ser.: ESA SP
Ser. no.: 688
4.

Conference Proceedings
Conference Proceedings
4. UV and Visible Raman Spectroscopy Applied to sSi/Si1-xGex and sSOI Stacks
D. Rouchon ; J. Hartmann ; A. Crisci ; M. Mermoux
Pub. info.: SiGe, Ge, and Related Compounds 3: Materials, Processing, and Devices.  pp.181-188,  2008.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(10)
5.

Conference Proceedings
Conference Proceedings
5. Strain in Epitaxial Si/SiGe Graded Buffer Structures Grown on Si (100), Si (110) and Si(111): a Raman Spectroscopy Study
D. Rouchon ; V. Destefanis ; J. Hartmann ; A. Crisci ; M. Mermoux
Pub. info.: SiGe, Ge, and Related Compounds 3: Materials, Processing, and Devices.  pp.203-214,  2008.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(10)