1.

Conference Proceedings
Conference Proceedings
1. Fault tolerant techniques for integrated circuits in submicron and nanotechnologies
A. Bacivarov
Pub. info.: Advanced topics in optoelectronics, microelectronics, and nanotechnologies III : 24-26 November 2006, Bucharest, Romania.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6635
2.

Conference Proceedings
Conference Proceedings
2. Control charts for non-Gaussian distributions
F. Babus ; A. Kobi ; Th. Tiplica ; I. Bacivarov ; A. Bacivarov
Pub. info.: Advanced topics in optoelectronics, microelectronics, and nanotechnologies III : 24-26 November 2006, Bucharest, Romania.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6635
3.

Conference Proceedings
Conference Proceedings
3. Quality assurance and management in microelectronics companies: ISO 9000 versus Six Sigma
R. Lupan ; A. Kobi ; C. Robledo ; I. Bacivarov ; A. Bacivarov
Pub. info.: Advanced topics in optoelectronics, microelectronics, and nanotechnologies IV : 28-31 November 2008, Constanta, Romania.  pp.72972L-1-72972L-6,  2009.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 7297