1.

Conference Proceedings
Conference Proceedings
1. Nitridation of the SiO2/SiC Interface by N+ Implantation: Hall versus Field Effect Mobility in n-Channel Planar 4H-SiC MOSFETs
F. Moscatelli ; A. Poggi ; S. Solmi ; R. Nipoti ; A. Armigliato
Pub. info.: Silicon carbide and related materials 2009 : selected peer reviewed papers from the International Conference on Silicon Carbide and Related Materials 2009, Nurnberg, Germany, October 11-16, 2009.  pp.491-494,  2010.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 645-648
2.

Conference Proceedings
Conference Proceedings
2. Structural and Analytical Characterization by Scanning Transmission Electron Microscopy of Silicon-based Nanostructures
A. Armigliato ; R. Balboni ; A. Parisini
Pub. info.: Analytical Techniques for Semiconductor Materials and Process Characterization 5 (ALTECH 2007) (plus Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes).  pp.57-64,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 10(1)