1.

Conference Proceedings

Conference Proceedings
Li,J. ; Li,X. ; Ying,A. ; Zao,A. ; Zhang,X.
Pub. info.: Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California.  pp.84-87,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3275
2.

Conference Proceedings

Conference Proceedings
Li,X. ; He,Q. ; Wu,M. ; Yan,Y. ; Jin,G.
Pub. info.: Advances in optical information processing VIII : 15-16 April 1998, Orlando, Florida.  pp.214-218,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3388
3.

Conference Proceedings

Conference Proceedings
Huang,Q. ; Li,X.
Pub. info.: Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China.  pp.93-104,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3558
4.

Conference Proceedings

Conference Proceedings
Li,M. ; Li,X. ; Song,X. ; Ge,Z. ; Zhang,X.
Pub. info.: Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China.  pp.64-66,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3557
5.

Conference Proceedings

Conference Proceedings
Cui,Y. ; Pu,T. ; Ni,G. ; Zhong,Y. ; Li,X.
Pub. info.: Electronic imaging and multimedia systems II : 18-19 September, 1998, Beijing, China.  pp.286-292,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3561
6.

Conference Proceedings

Conference Proceedings
Li,X. ; Ni,G. ; Gui,Y. ; Pu,T. ; Zhong,Y.
Pub. info.: Electronic imaging and multimedia systems II : 18-19 September, 1998, Beijing, China.  pp.293-299,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3561
7.

Conference Proceedings

Conference Proceedings
Li,X. ; Hu,X. ; Lu,H. ; Zhao,J. ; Fang,J.
Pub. info.: Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China.  pp.71-76,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3553
8.

Conference Proceedings

Conference Proceedings
Hu,X. ; Li,X. ; Lu,H. ; Zhao,J. ; Gong,H. ; Fang,J.
Pub. info.: Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China.  pp.85-89,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3553
9.

Conference Proceedings

Conference Proceedings
Zhou,G. ; Li,X. ; Xue,W. ; Li,Z. ; Jia,S.
Pub. info.: Fiber optic components and optical communication II : 18-19 September, 1998, Beijing, China.  pp.323-327,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3552
10.

Conference Proceedings

Conference Proceedings
Meijer,G.C.M. ; van der Goes,F.M.L. ; de Jong,P.C. ; Li,X. ; Toth,F.N.
Pub. info.: Smart structures and materials 1998 : smart electronics and MEMS : 2-4 March 1998, San Diego, California.  pp.246-259,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3328