Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California. pp.84-87, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Advances in optical information processing VIII : 15-16 April 1998, Orlando, Florida. pp.214-218, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.93-104, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China. pp.64-66, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Electronic imaging and multimedia systems II : 18-19 September, 1998, Beijing, China. pp.286-292, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Electronic imaging and multimedia systems II : 18-19 September, 1998, Beijing, China. pp.293-299, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China. pp.71-76, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Detectors, focal plane arrays, and imaging devices II : 18-19 September 1998, Beijing, China. pp.85-89, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fiber optic components and optical communication II : 18-19 September, 1998, Beijing, China. pp.323-327, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Meijer,G.C.M. ; van der Goes,F.M.L. ; de Jong,P.C. ; Li,X. ; Toth,F.N.
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Smart structures and materials 1998 : smart electronics and MEMS : 2-4 March 1998, San Diego, California. pp.246-259, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering