Remote sensing and modeling of ecosystems for sustainability II : 2-3 August 2005, San Diego, California, USA. pp.58840L-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Remote sensing and modeling of ecosystems for sustainability II : 2-3 August 2005, San Diego, California, USA. pp.58840K-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Wang, X. ; Zhang, C. ; Zhang, X. ; Feng, G. ; Xu, X.
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ICO20 : lasers and laser technologies : 21-26 August, 2005, Changchun, China. pp.602827-602827, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Awazu, K. ; Wang, X. ; Fujimaki, M. ; Imai, H. ; Kuriyama, T. ; Ohki, Y.
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Nanoengineering: fabrication, properties, optics, and devices II : 3-4 August, 2005, San Diego, California. pp.593106-593106, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
ICO20 : lasers and laser technologies : 21-26 August, 2005, Changchun, China. pp.602824-602824, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Wang, X. ; Wang, B. ; McManamon, P. F. ; Pouch, J. J. ; Miranda, F. A. ; Bos, P. J.
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Advanced wavefront control : methods, devices, and applications III : 31 July-2 August 2005, San Diego, California, USA. pp.589411-589411, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Joshi, A. ; Wang, X. ; Mohr, D. ; Becker, D. ; Wree, C.
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Enabling photonics technologies for defense, security, and aerospace applications : 31 March-1 April 2005, Orlando, Florida, USA. pp.39-50, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Michalkiewicz, A. ; Kujawinska, M. ; Krezel, J. ; Salbut, L. ; Wang, X. ; Bos, P. J.
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Eighth International Symposium on Laser Metrology : macro-, micro-, and nano-technologies applied in science, engineering, and industry : 14-18 February, 2005, Merida, Yucatan, Mexico. pp.144-152, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Kropf, M. ; Pedrick, M. ; Wang, X. ; Tittmann, B. R.
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Advanced sensor technologies for nondestructive evaluation and structural health monitoring : 8-10 March 2005, San Diego, California, USA. pp.135-141, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Design and process integration for microelectronic manufacturing III : 3-4 March 2005, San Jose, California, USA. pp.361-367, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering