Geoinformatics 2007, Remotely sensed data and information : 25-27 May 2007, Nanjing, China. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Conference on Photonics and Imaging in Biology and Medicine. 2007. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical test and measurement technology and equipment. 1 pp.67230O-1-67230O-6, 2007. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Measurement theory and systems and aeronautical equipment : Seventh International Symposium on Instrumentation and Control Technology, 10-13 October 2008, Beijing, China. pp.71280T-1-71280T-6, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Lasers in material processing and manufacturing III : 12-14 November 2007, Beijing, China. pp.682518-1-682518-8, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Light-emitting diode materials and devices II : 12-14 November 2007, Beijing, China. pp.682817-1-682817-7, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Conference on Thin Film Physics and Applications : 25-28 September 2007, Shanghai, China. pp.69840V-1-69840V-4, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering
Sixth International Conference on Thin Film Physics and Applications : 25-28 September 2007, Shanghai, China. pp.69840P-1-69840P-5, 2008. Bellingham, Wash.. Society of Photo-optical Instrumentation Engineers
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Proceedings of SPIE - the International Society for Optical Engineering