Ramberg, C. Eric ; Wang, Y. ; Fan, Q. ; McDermott, E. ; Wang, J. ; Kenyon, K. ; Hornbostel, M. ; Guan, S. ; Nguyen, S.
Pub. info.:
Amorphous and nanocrystalline metals : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A.. pp.151-158, 2004. Warrendale. Materials Research Society
Optical design and testing : 15-18 October 2002, Shanghai, China. pp.677-682, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ramberg, C. Eric ; Wang, Y. ; Fan, Q. ; McDermott, E. ; Wang, J. ; Kenyon, K. ; Field, M. ; Hornbostel, M. ; Guan, S. ; Nguyen, S.
Pub. info.:
Advanced data storage materials and characterization techniques : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A.. pp.271-276, 2004. Warrendale, Pa.. Materials Research Society
THERMEC '2003 : International Conference on Processing & Manufacturing of Advanced Materials, July 7-11, 2003, Leganés, Madrid, Spain. pp.2479-2484, 2003. Zuerich-Uetikon, Switzerland. Trans Tech Publications
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies. pp.61492J-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Wang, Y. ; Qi, C. ; Wang, D. ; Wang, J. ; Wang, P.
Pub. info.:
Sixth International Symposium on Instrumentation and Control Technology: Sensors, Automatic Measurement, Control, and Computer Simulation. pp.635828-635828, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering