1.

Conference Proceedings

Conference Proceedings
Liu,Y. ; Rodrigues,M.A.
Pub. info.: Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California.  pp.323-331,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3966
2.

Conference Proceedings

Conference Proceedings
Liu,Y. ; Claypool,M.
Pub. info.: Multimedia computing and networking 2000 : 24-26 January 2000, San Jose, California.  pp.73-84,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3969
3.

Conference Proceedings

Conference Proceedings
Liu,Y. ; Wang,K.W.
Pub. info.: Smart structures and materials 2000 : damping and isolation : 6-8 March 2000, Newport Beach, California.  pp.73-84,  2000.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3989
4.

Conference Proceedings

Conference Proceedings
Dixit,S.S. ; Azordegan,A.R. ; Liu,Y.
Pub. info.: Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California.  pp.819-828,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3998
5.

Conference Proceedings

Conference Proceedings
Lin,L. ; Choi,C. ; Liu,Y. ; Karve,G.V. ; Bihari,B. ; Chen,R.T.
Pub. info.: Optoelectronic interconnects VII : photonics packaging and integrations II : 24-26 January 2000, San Jose, California.  pp.312-317,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3952
6.

Conference Proceedings

Conference Proceedings
Liu,Y. ; Liu,W. ; Zhang,B. ; Wang,X. ; Jiang,J.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.252-256,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
7.

Conference Proceedings

Conference Proceedings
Wang,J. ; Hu,Z. ; Liu,Y. ; Liang,J.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.10-14,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
8.

Conference Proceedings

Conference Proceedings
Liu,Y. ; Yamamura,T. ; Tanaka,T. ; Ohnishi,N.
Pub. info.: Intelligent robots and computer vision XIX : algorithms, techniques, and active vision : 7-8 November 2000, Boston, USA.  pp.171-180,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4197
9.

Conference Proceedings

Conference Proceedings
Chu,G. ; Liu,X. ; Liu,Y. ; Wu,D. ; Wang,L.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.765-768,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086
10.

Conference Proceedings

Conference Proceedings
Chu,G. ; Liu,X. ; Wu,D. ; Liu,Y. ; Zhao,J. ; Wang,L.
Pub. info.: Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings.  pp.769-772,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4086