Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California. pp.323-331, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Multimedia computing and networking 2000 : 24-26 January 2000, San Jose, California. pp.73-84, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Smart structures and materials 2000 : damping and isolation : 6-8 March 2000, Newport Beach, California. pp.73-84, 2000. Bellingham, Washington. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California. pp.819-828, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optoelectronic interconnects VII : photonics packaging and integrations II : 24-26 January 2000, San Jose, California. pp.312-317, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.252-256, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.10-14, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Intelligent robots and computer vision XIX : algorithms, techniques, and active vision : 7-8 November 2000, Boston, USA. pp.171-180, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.765-768, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Fourth International Conference on Thin Film Physics and Applications : 8-11 May 2000, Shanghai, China : proceedings. pp.769-772, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering