1.

Conference Proceedings
Conference Proceedings
1. Cathodoluminescence Study on Dislocation-Related Luminescence in Silicon
Sekiguchi,T. ; Sumino,K.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1201-1206,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings
Conference Proceedings
2. Energy States of Deformation-Induced Dislocations in Silicon Crystals
Kusanagi,S. ; Sekiguchi,T. ; Sumino,K.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1195-1200,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
3.

Conference Proceedings
Conference Proceedings
3. Precipitation of Cu,Ni and Fe on Frank-Type Partial Dislocations in Czochralski-Grown Silicon
Shen,B. ; Sekiguchi,T. ; Sumino,K.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1207-1212,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
4.

Conference Proceedings
Conference Proceedings
4. Electronic States Associated with Straight Dislocations in p-Type Silicon Studied by Means of Electric-Dipole Spin Resonance
Kveder,V. ; Sekiguchi,T. ; Sumino,K.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1189-1194,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
5.

Conference Proceedings
Conference Proceedings
5. Thermal and Optical Emission Processes of Electrons and Holes from EL2 in n- and p-Type GaAs
Okushi,H. ; Sekiguchi,T. ; Tokumaru,Y. ; Sumino,K.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.261-266,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
6.

Conference Proceedings
Conference Proceedings
6. Me0tastability and Negative-U Properties for Hydrogen-Related Radiation-Induced Defect in Silicon
Markevich,V.P. ; Medvedeva,I.F. ; Murin,L.I. ; Sekiguchi,T. ; Suezawa,M. ; Sumino,K.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.945-950,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201