Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California. pp.84-87, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
New image processing techniques and applications : algorithms, methods, and components II : 18-19 June 1997, Munich, FRG. pp.156-160, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG. pp.396-399, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of biomedical sensing and imaging technologies, 26-27 January 1998, San Jose, California. pp.250-257, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore. pp.398-403, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.75-78, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China. pp.336-344, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering