1.

Conference Proceedings

Conference Proceedings
Li,J. ; Li,X. ; Ying,A. ; Zao,A. ; Zhang,X.
Pub. info.: Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California.  pp.84-87,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3275
2.

Conference Proceedings

Conference Proceedings
Li,J. ; Li,X. ; Ying,A. ; Zao,A. ; Zhang,X.
Pub. info.: New image processing techniques and applications : algorithms, methods, and components II : 18-19 June 1997, Munich, FRG.  pp.156-160,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3101
3.

Conference Proceedings

Conference Proceedings
Li,J. ; Ying,A. ; Li,X. ; Zhang,X. ; Zao,A.
Pub. info.: Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG.  pp.396-399,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3100
4.

Conference Proceedings

Conference Proceedings
Li,J. ; Xiao,S. ; Li,X. ; Ying,A. ; Zhang,X. ; Zhuo,A.
Pub. info.: Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore.  pp.398-403,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3897
5.

Conference Proceedings

Conference Proceedings
Li,J. ; Zao,A. ; Lei,C. ; Chan,X. ; Li,X. ; Zhang,X. ; Ying,A. ; Wan,X.
Pub. info.: Automated optical inspection for industry : 6-7 November 1996, Beijing, China.  pp.75-78,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2899
6.

Conference Proceedings

Conference Proceedings
Li,J. ; Li,D. ; Zhang,X. ; Li,X. ; Zhao,A.
Pub. info.: Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China.  pp.336-344,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3557
7.

Conference Proceedings

Conference Proceedings
Li,X. ; Tan,R. ; Li,J. ; Shi,H.
Pub. info.: Lasers in medicine and dentistry : diagnostics and treatment : 4-5 November 1996, Beijing, China.  pp.200-205,  1996.  Bellingham, Wash.,.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2887
8.

Conference Proceedings

Conference Proceedings
Li,J. ; Li,X. ; Ying,A. ; Xiao,S. ; Wang,M. ; Zhao,A.
Pub. info.: Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China.  pp.276-281,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3557
9.

Conference Proceedings

Conference Proceedings
Li,J. ; Chen,J. ; Fan,Z. ; Chen,Q. ; Li,X.
Pub. info.: Laser processing of materials and industrial applications II : 16-19 September 1998, Beijing, China.  pp.199-204,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3550
10.

Conference Proceedings

Conference Proceedings
Li,J. ; Li,X. ; Fan,Z. ; Chen,Q. ; Chen,J.
Pub. info.: Laser processing of materials and industrial applications II : 16-19 September 1998, Beijing, China.  pp.190-194,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3550