1.

Conference Proceedings
Conference Proceedings
1. Measurement of roughness of optical surface by focal plane CCD camera
Li,J. ; Li,X. ; Ying,A. ; Zao,A. ; Zhang,X.
Pub. info.: Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California.  pp.84-87,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3275
2.

Conference Proceedings
Conference Proceedings
2. Optical and structural characteristics of lnGaAsIGaAs strained-layer superlattice
Li,M. ; Li,X. ; Song,X. ; Ge,Z. ; Zhang,X.
Pub. info.: Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China.  pp.64-66,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3557
3.

Conference Proceedings
Conference Proceedings
3. New subjective evaluation on optical image quality
Li,J. ; Li,X. ; Ying,A. ; Zao,A. ; Zhang,X.
Pub. info.: New image processing techniques and applications : algorithms, methods, and components II : 18-19 June 1997, Munich, FRG.  pp.156-160,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3101
4.

Conference Proceedings
Conference Proceedings
4. Frequency analysis for roughness of optical surface by focal plane CCD camera
Li,J. ; Ying,A. ; Li,X. ; Zhang,X. ; Zao,A.
Pub. info.: Sensors, sensor systems, and sensor data processing : June 16-17 1997, Munich, FRG.  pp.396-399,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3100
5.

Conference Proceedings
Conference Proceedings
5. Analysis of the thickness measurement of multilayer optical thin films with grazing incident x ray
Li,X. ; Song,X. ; Qu,Y. ; Li,M. ; Zhang,X.
Pub. info.: Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China.  pp.470-473,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3175
6.

Conference Proceedings
Conference Proceedings
6. Testing method for microprofile of optical supersmooth surface
Li,J. ; Xiao,S. ; Li,X. ; Ying,A. ; Zhang,X. ; Zhuo,A.
Pub. info.: Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore.  pp.398-403,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3897
7.

Conference Proceedings
Conference Proceedings
7. Nondestructive measurement of layer thickness in double heterostructures x ray by double crystal diffraction
Qu,Y. ; Li,X. ; Song,X. ; Zhang,X. ; Wang,L. ; Qie,X.
Pub. info.: Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China.  pp.378-380,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3175
8.

Conference Proceedings
Conference Proceedings
8. MBE technology and semiconductor laser material growth
Liu,G. ; Zhang,Q. ; Yang,H. ; Zhang,X. ; Li,X. ; Qu,Y. ; Song,X. ; Wang,X.
Pub. info.: Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China.  pp.408-411,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3175
9.

Conference Proceedings
Conference Proceedings
9. High-speed computer color testing and matching system online
Li,J. ; Zao,A. ; Lei,C. ; Chan,X. ; Li,X. ; Zhang,X. ; Ying,A. ; Wan,X.
Pub. info.: Automated optical inspection for industry : 6-7 November 1996, Beijing, China.  pp.75-78,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2899
10.

Conference Proceedings
Conference Proceedings
10. Evaluation of optical supersmooth surface using AFM and comparison to interference method
Li,J. ; Li,D. ; Zhang,X. ; Li,X. ; Zhao,A.
Pub. info.: Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China.  pp.336-344,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3557