Blank Cover Image

Experimental apparatus and software design for dynamic long-term reliability testing of a spring-mass MEMS device [6111-23]

Author(s):
Publication title:
Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6111
Pub. Year:
2006
Page(from):
61110J
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819461537 [0819461539]
Language:
English
Call no.:
P63600/6111
Type:
Conference Proceedings

Similar Items:

Vartanian, V., Beu, L., Stephens, T., Rivers, J., Perez, B., Kiehlbauch, M., Tonnisand, E., Graves, D.

Electrochemical Society

Inaudi, D.

SPIE - The International Society of Optical Engineering

Petzold, M., Katzer, D., Wiemer, M., Bagdahn, J.

SPIE-The International Society for Optical Engineering

Hartzell,A.L., Woodilla,D.J.

SPIE-The International Society for Optical Engineering

Buchheit, T. E., Bataille, C. C., Michael, J. R., Boyce, B. L.

American Society of Mechanical Engineers

Miller, D. C., Hughes. W. L., Wang, Z. L., Gall K, Stoldt C R

SPIE - The International Society of Optical Engineering

O’Reilly, R. P.

SPIE - The International Society of Optical Engineering

J. De Coster, L. Haspeslagh, A. Witvrouw, I. De Wolf

Society of Photo-optical Instrumentation Engineers

McCulloch, S., Burnell, G., Boon, T., Maier, R. R. J., Barton, J. S., Harrison, P. B., Rigg, E. J., Jones, J. D. C.

SPIE - The International Society of Optical Engineering

Charbon, E., Gunther, N. J., Boiko, D. L., Beretta, G. B.

SPIE - The International Society of Optical Engineering

L.C. Yu, K.P. Cheung, G. Dunne, K. Matocha, J.S. Suehle

Trans Tech Publications

Ahmadian, M., Seigler, T.M., Clapper, D., Sprouse, A.

Society of Automotive Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12