1.

Conference Proceedings
Conference Proceedings
1. 'Recovery' Effect of Electron Induced Damage in 4H-SiC Schottky Diodes
Castaldini, A. ; Cavallini, A. ; Rigutti, L. ; Nava, F. ; Fuochi, P.G. ; Vanni, P.
Pub. info.: Radiation effects and ion-beam processing of materials : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A..  pp.611-616,  2004.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 792
2.

Conference Proceedings
Conference Proceedings
2. Electrical and Optical Characterization of Electron Irradiated X Rays Detectors Based on 4H-SiC Epitaxial Layers
Le Donne, A. ; Binetti, S. ; Acciarri, M. ; Castaldini, A. ; Nava, F. ; Cavallini, A. ; Pizzini, S.
Pub. info.: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.1503-1506,  2004.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 457-460