1.

Conference Proceedings
Conference Proceedings
1. Defect creation mechanisms due to hot-carriers in 0.15 μm SIMOX MOSFETs
Dimitrakis, P. ; Jomaah, J. ; Balestra, F. ; Papaioannou, G.J.
Pub. info.: Progress in SOI structures and devices operating at extreme conditions.  pp.263-268,  2002.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 58
2.

Conference Proceedings
Conference Proceedings
2. Characterization and modeling of advanced SOI materials and devices
Allibert, F. ; Pretet, J. ; Ernst, T. ; Jomaah, J. ; Cristoloveanu, S.
Pub. info.: Progress in SOI structures and devices operating at extreme conditions.  pp.239-248,  2002.  Dordrecht.  Kluwer Academic Publishers
Title of ser.: NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.: 58