1.

Conference Proceedings
Conference Proceedings
1. Ion Implantation and 1 MeV Electron Irradiation of 4H-SiC-Comparison Studies
Evwaraye, A.O. ; Smith, S.R. ; Mitchel, W.C. ; Farlow, G.C. ; Capano, M.A.
Pub. info.: Silicon carbide 2004--materials, processing and devices : symposium held April 14-15, 2004, San Francisco, California, U.S.A..  pp.223-228,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 815
2.

Conference Proceedings
Conference Proceedings
2. Optically Induced Transitions among Point Defects in High Purity and Vanadium-Doped Semi-Insulating 4H SiC
Zvanut, M.E. ; Konovalov, V.V. ; Mitchel, W.C. ; Mitchell, W.D.
Pub. info.: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.489-492,  2004.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 457-460
3.

Conference Proceedings
Conference Proceedings
3. Photo-EPR and Hall Measurements on Undoped High Purity Semi-Insulating 4H-SiC Substrates
Kalabukhova, E.N. ; Lukin, S.N. ; Savchenko, D.V. ; Mitchel, W.C. ; Mitchell, W.D.
Pub. info.: Silicon carbide and related materials 2003 : ICSCRM, 2003 : proceedings of the 10th International Conference on Silicon Carbide and Related Materials 2003, Lyon, France, October 5-10, 2003.  pp.501-504,  2004.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 457-460
4.

Conference Proceedings
Conference Proceedings
4. Intrinsic deep levels in semi-insulating silicon carbide
Mitchel, W.C. ; Mitchell, W.D. ; Landis, G.
Pub. info.: Quantum Sensing and Nanophotonic Devices.  pp.284-289,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5359