1.

Conference Proceedings

Conference Proceedings
Burke,P. ; Lowell,J.K. ; Jastrzebski,L.
Pub. info.: Optical Characterization Techniques for High-P6rfo「nwic6 Microelectronic Device Manufacturing II.  pp.27-37,  1995.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2638
2.

Conference Proceedings

Conference Proceedings
Ostapenko,S.S. ; Savchuk,A.U. ; Nowak,G. ; Lagowski,J. ; Jastrzebski,L.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1897-1902,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201