Search records | 東京工業大学附属図書館文献データベース

You can search for articles included in proceedings of international conferences and technical papers which Tokyo Tech Library holds.
Tokyo Tech members can obtain tables of contents of 17,000 foreign journals by SwetScan. Tokyo Tech Library does not cover all of them.
List of Searchable Databases

Clear Form

Search for other sites by same keyword(s).

CiNii Books

NDL Search

WebcatPlus

amazon

カーリル

WorldCat

Filter

Title:

Author:

ISBN / ISSN / Paper No:

Source Title:

Publisher:

Publication Year:

～

Clear Form

Type:

Conference Proceedings

Technical Paper

Academic Journal

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

14 results

Conference Proceedings

1. Transmission electron microscopy studies of the polycrystalline silison-SiO2 interface

Bravman, J. C. ; Sinclair, R.

Pub. info.:	Interfaces and contacts : symposium held November 1982 in Boston, Massachusetts, U.S.A.. pp.153-162, 1983. New York. North-Holland
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	18

Conference Proceedings

2. The morphology of the polysilicon-Si02 interface

Bravaman, J. C. ; Sinclair, R.

Pub. info.:	Thin films and interfaces II : symposium held November 1983, in Boston, Massachusetts, U.S.A.. pp.311-316, 1984. New York. North-Holland
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	25

Conference Proceedings

3. POLYSILANES AS POSIBLE PRECURSORS TO SILICON CARBIDE

West, R. ; Sinclair, R.

Pub. info.:	Better ceramics through chemistry : symposium held February 1984 in Albuquerque, New Mexico, U.S.A.. pp.387-390, 1984. New York. North-Holland
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	32

Conference Proceedings

4. THE PHASE FORMATION SEQUENCE IN TITANIUM-SILICON THIN FILMS

Beyers, R. ; Sinclair, R.

Pub. info.:	Thin films : interfaces and phenomena : symposium held December 2-6, 1985, Boston, Massachusetts, USA. pp.43-44, 1985. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	54

Conference Proceedings

5. CRYSTALLINE-TO-AMORPHOUS TRANSITIONS IN Ti-Ni ALLOYS

Pelton, A.R. ; Moine, P. ; Noack, M.A. ; Sinclair, R.

Pub. info.:	Materials problem solving with the transmission electron microscope : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.. pp.291-302, 1986. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	62

Conference Proceedings

6. IN-SITU HIGH RESOLUTION TRANMISSION ELECTRON MICROSCOPY OF DYNAMIC EVENTS DURING THE AMORPHOUS TO CRYSTALLINE PHASE TRANSFORMATION IN SILICON

Parker, M.A. ; Sigmon, T.W. ; Sinclair, R.

Pub. info.:	Materials problem solving with the transmission electron microscope : symposium held December 2-4, 1985, Boston, Massachusetts, U.S.A.. pp.311-322, 1986. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	62

Conference Proceedings

7. IN SITU HIGH RESOLUTION ELECTRON MICROSCOPY FOR INTERFACE STUDIES

Parker, M. A. ; Sinclair, R.

Pub. info.:	Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, U.S.A.. pp.379-382, 1987. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	82

Conference Proceedings

8. DYNAMIC ORSERVATION OF ATOMIC-LEVEL EVENTS IN CADMIUM TELLURIDE BY HIGH RESOLUTION TEM

Tamashita, T. ; Sinclair, R.

Pub. info.:	Defects in semiconductors II : symposium held November 1982 in Boston, Massachusetts, U.S.A.. pp.295-300, 1983. New York. North-Holland
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	14

Conference Proceedings

9. *MICROSTRUCTURES OF POLYSILICON

Sinclair, R. ; Carim, A. H. ; Morgiel, J. ; Bravman, J. C.

Pub. info.:	Polysilicon films and interfaces : symposium held December 1-3, 1987, Boston, Massachusetts, U.S.A.. pp.27-38, 1988. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	106

10.

Conference Proceedings

10. Imaging of defects in cadmium telluride using high resolution transmission electron microscopy

Ponce, F.A. ; Yamashita, T. ; Bube, R.H. ; Sinclair, R.

Pub. info.:	Defects in semiconductors : proceedings of the Materials Research Society Annual Meeting, November 1980, Copley Plaza Hotel, Boston, Massachusetts, U.S.A.. pp.503-508, 1981. New York. North Holland
Title of ser.:	Materials Research Society symposia proceedings
Ser. no.:	2

14 results

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

Filtering by: