1.

Conference Proceedings
Conference Proceedings
1. DEFECT STATES INDUCED BY RAPID THERMAL ANNEALING IN VIRGIN OR IMPLANTED CZOCHRALSKY-GROWN SILICON
Remram, M. ; Barbier, D. ; Joly, J.?F. ; Laugier, A.
Pub. info.: Beam-solid interactions and transient processes : symposium held December 1-4, 1986, Boston, Massachusetts, U.S.A..  pp.705-710,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 74
2.

Conference Proceedings
Conference Proceedings
2. IMPLANTED IMPURITY INCORPORATION AND SEGREGATION PHENOMENA INDUCED BY PEBA IN SILICON
Chaussemy, G. ; Barbier, D. ; Laugier, A.
Pub. info.: Energy beam-solid interactions and transient thermal processing/1984 : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A..  pp.257-264,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 35
3.

Conference Proceedings
Conference Proceedings
3. A STUDY OF ELECTRICALLY ACTIVE DEFECTS INDUCED BY PULSED-ELECTRON-BEAM ANNEALING IN (100) N-TYPE VIRGIN SILICON
Doghmane, M. S. ; Barbier, D. ; Laugier, A.
Pub. info.: Energy beam-solid interactions and transient thermal processing/1984 : symposium held November 26-30, 1984, Boston, Massachusetts, U.S.A..  pp.287-292,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 35
4.

Conference Proceedings
Conference Proceedings
4. ARSENIC REDISTRIBUTION AND OUTDIFFUSION IN IMPLANTED CZOCHRALSKI-GROWN P-TYPE SILICON DURING RAPID THERMAL ANNEALING
Chaussemy, G. ; Canut, B. ; Kumar, S. N. ; Barbier, D. ; Laugier, A.
Pub. info.: Fundamentals of beam-solid interactions and transient thermal processing : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.695-700,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 100
5.

Conference Proceedings
Conference Proceedings
5. ON THE ORIGIN OF THE NEW ELECTRON TRAPS INDUCED BY RAPID THERMAL ANNEALING IN GaAs USING CAPPING PROXIMITY TECHNIQUE
Marrakchi, G. ; Chaussemy, G. ; Laugier, A. ; Guillot, G.
Pub. info.: Advances in materials, processing, and devices in III-V compound semiconductors.  pp.27-32,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 144
6.

Conference Proceedings
Conference Proceedings
6. ARSENIC IMPLANT ACTIVATION AND REDISTRIBUTION IN P-TYPE SILICON INDUCED BY PULSED ELECTRON BEAM ANNEALING
Barbier, D. ; Baghdadi, M. ; Laugier, A. ; Cachard, A.
Pub. info.: Laser-solid interactions and transient thermal processing of materials : symposium held November 1982 in Boston, Massachusetts, U.S.A..  pp.419-424,  1983.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 13
7.

Conference Proceedings
Conference Proceedings
7. PULSED ELECTRON BEAM ANNEALING INDUCED DEEP LEVEL DEFECTS IN VIRGIN SILICON
Barbier, D. ; Kechouane, M. ; Chantre, A. ; Laugier, A.
Pub. info.: Laser-solid interactions and transient thermal processing of materials : symposium held November 1982 in Boston, Massachusetts, U.S.A..  pp.449-454,  1983.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 13
8.

Conference Proceedings
Conference Proceedings
8. EFFETCS OF HEATING SAMPLES ON THE EXTENDED DEFECT GENERATION DURING PULSED ELECTRON BEAM ANNEALING OF SILICON
Pitaval, M. ; Ambri, M. ; Tholomier, M. ; Barbier, D. ; Chemisky, G. ; Laugier, A.
Pub. info.: Energy beam-solid interactions and transient thermal processing : symposium held November 1983 in Boston, Massachusetts, U.S.A..  pp.363-368,  1984.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 23
9.

Conference Proceedings
Conference Proceedings
9. THEORETICAL ANALYSIS OF HOMOGENEITY AND SURFACE DEGRADATION DURING PULSED ELECTRON BEAN ANNEALING OF GaAs AND InP
Laugier, A. ; Barbier, D. ; Chemisky, G.
Pub. info.: Energy beam-solid interactions and transient thermal processing : symposium held November 1983 in Boston, Massachusetts, U.S.A..  pp.699-706,  1984.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 23
10.

Conference Proceedings
Conference Proceedings
10. SPECTROSCOPIC INVESTIGATION OF ARSENIC-INDUCED SURFACE DEFECTS IN HIGH-DOSE As+ IMPLANTED RAPID THERMAL ANNEALED SILICON
Kumar, R. ; Chaussemy, G. ; Roura, P. ; Laugier, A.
Pub. info.: Characterization of the structure and chemistry of defects in materials : symposium held November 28-December 3, 1988, Boston, Massachusetts, U.S.A..  pp.215-220,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 138